2025

108.  Willis, S. A.; Chen, J.; Shadman, S. A.; Flannigan, D. J. Stability and Viability of Off-Axis Photoemission Geometries in 4D Ultrafast Electron Microscopy. Microsc. Microanal. 2025, 31, 1199-1201.

107.  Flannigan, D. J.; Zhang, Y. Revealing Defect-Seeded and Interfacial Generation Mechanisms of Photoinduced Coherent Phonons with 4D Ultrafast Electron Microscopy. Microsc. Microanal. 2025, 31, 1165-1167. (Invited)

106.  LaGrange, T.; Cattaneo, P.; Barwick, B.; Flannigan, D. J.; Weissenrieder, J.; Carbone, F. Laser-Driven Ultrafast Transmission Electron Microscopy. Nat. Rev. Methods Primers 2025, 5, 61. (Invited)

105.  Willis, S. A.; Flannigan, D. J. Influence of Photoemission Geometry on Timing and Efficiency in 4D Ultrafast Electron Microscopy. ChemPhysChem 2025, 26, e202401032 (Invited, Special collection: Physical Chemistry in North America) (Front cover article) arXiv:2411.07262

Off-Axis Geometry

2024

104.  Chen, J.; Willis, S. A.; Flannigan, D. J. Delineation of the Impact on Temporal Behaviors of Off-Axis Photoemission in an Ultrafast Electron Microscope. Rev. Sci. Instrum. 2024, 95, 093705. arXiv:2406.13614

r-TOF

103.  Willis, S. A.; Curtis, W. A.; Flannigan, D. J. Wehnelt Photoemission in an Ultrafast Electron Microscope: Stability and Usability. J. Appl. Phys. 2024, 136, 024901. arXiv:2404.01434

Wehnelt Photoemission

2023

102.  Flannigan, D. J.; VandenBussche, E. J. Pulsed-Beam Transmission Electron Microscopy and Radiation Damage. Micron 2023, 172, 103501. (Invited)

Temporal Events


101.  Willis, S. A.; Flannigan, D. J. Stable Photoemission from the Wehnelt Aperture Surface in 4D Ultrafast Electron Microscopy. Microsc. Microanal. 2023, 29 (Suppl. 1), 1842-1844.

Photoemission Behavior

2022

100.  Flannigan, D. J.; Curtis, W. A.; VandenBussche, E. J.; Zhang, Y. Low Repetition-Rate, High-Resolution Femtosecond Transmission Electron Microscopy. J. Chem. Phys. 2022, 157, 180903. (Invited)

TOC Graphic


99.  Curtis, W. A.; Willis, S. A.; Flannigan, D. J. Single-Photoelectron Collection Efficiency in 4D Ultrafast Electron Microscopy. Phys. Chem. Chem. Phys. 2022, 24, 14044-14054.

TOC Graphic


98.  Engen, P. E.; Flannigan, D. J. Orientation-Specific CDW Phase Transition Temperatures in 1T-TaS2. Microsc. Microanal. 2022, 28 (Suppl. 1), 2302-2305.

CDW Phase Transition

97.  Chen, J.; Flannigan, D. J. A Quantitative Method for In Situ Pump-Beam Metrology in 4D Ultrafast Electron Microscopy. Ultramicroscopy 2022, 234, 113485.

UEM Metrology


96.  Gnabasik, R. A.; Suri, P. K.; Chen, J.; Flannigan, D. J. Imaging Coherent Phonons and Precursor Dynamics in LaFeAsO with 4D Ultrafast Electron Microscopy. Phys. Rev. Mater. 2022, 6, 024802.

LaFeAsO

2021

95.  Zhang, Y.; Choi, M.-K.; Haugstad, G.; Tadmor, E. B.; Flannigan, D. J. Holey Substrate-Directed Strain Patterning in Bilayer MoS2. ACS Nano 2021, 15, 20253-20260.
Archived data: https://doi.org/10.13020/14jz-pj24

TOC Graphic


94.  Curtis, W. A.; Flannigan, D. J. Toward Å-fs-meV Resolution in Electron Microscopy: Systematic Simulation of the Temporal Spread of Single-Electron Packets. Phys. Chem. Chem. Phys. 2021, 23, 23544-23553. (Invited, Themed issue: Developments in Ultrafast Spectroscopy) (2021 PCCP HOT Article)
Archived data: https://doi.org/10.13020/91yh-x581

TOC Graphic


93.  Zhang, Y.; Flannigan, D. J. Imaging Nanometer Phonon Softening at Crystal Surface Steps with 4D Ultrafast Electron Microscopy. Nano Lett. 2021, 21, 7332-7338.
Archived data: https://doi.org/10.13020/qxmn-1t31

TOC Graphic


92.  Reisbick, S. A.; Zhang, Y.; Chen. J.; Engen, P. E.; Flannigan, D. J. Coherent Phonon Disruption and Lock-In During a Photoinduced Charge-Density-Wave Phase Transition. J. Phys. Chem. Lett. 2021, 12, 6439-6447. (Front cover article) chemrxiv.14357342.v2
Archived data: https://doi.org/10.13020/gr0s-fm32

TOC Graphic


91.  Chen, J.; Leighton, C.; Flannigan, D. J. A Quantitative Method for In-Situ Pump-Beam Metrology in Ultrafast Electron Microscopy. Microsc. Microanal. 2021, 27 (Suppl. 1), 3416-3418. (Student Scholar Awardee)

UEM Metrology

90.  Curtis, W. A.; Flannigan, D. J. Single-Electron Temporal Behavior in the Gun Region of the Tecnai Femto UEM. Microsc. Microanal. 2021, 27 (Suppl. 1), 3420-3422.

Single Electron Behavior

89.  Flannigan, D.; Chen, J.; Curtis, W.; Du, D.; Engen, P.; VandenBussche, E.; Zhang, Y. Time-Resolved TEM Beyond Fast Detectors. Acta Crystallogr. A 2021, 77, C420. (Invited)

Single-Shot to Stroboscopic

88.  Du, D. X.; Reisbick, S. A.; Flannigan, D. J. UEMtomaton: A Source-Available Platform to Aid in Start-up of Ultrafast Electron Microscopy Labs. Ultramicroscopy 2021, 223, 113235. chemrxiv.13160717.v1

Software licensing information can be found here.

UEMtomaton Layout

2020

87.  VandenBussche, E. J.; Clark, C. P.; Holmes, R. J.; Flannigan, D. J. Mitigating Damage to Hybrid Perovskites Using Pulsed-Beam TEM. ACS Omega 2020, 5, 31867-31871. chemrxiv.12756461.v2
Archived data: https://doi.org/10.13020/nsts-5c07

ACS Omega TOC Graphic


86.  VandenBussche, E. J.; Flannigan, D. J. High-Resolution Analogue of Time-Domain Phonon Spectroscopy in the Transmission Electron Microscope. Philos. Trans. R. Soc. A 2020, 378, 20190598. (Invited, Themed issue: Dynamic In-Situ Microscopy Relating Structure and Function)
Archived data: https://doi.org/10.13020/36wa-rj64

UEM Dispersion Curves


85.  Flannigan, D. J.; Gnabasik, R. A.; Zhang, Y. Femtosecond TEM: Imaging Nanoscale Materials Dynamics at Temporal Extremes. Microsc. Microanal. 2020, 26 (Suppl. 2), 1126-1127. (Invited)

84.  Flannigan, D. J.; VandenBussche, E. J. Pulsed-Laser-Driven TEM for Studying Temporal Aspects of Beam Damage. Microsc. Microanal. 2020, 26 (Suppl. 2), 2066-2067. (Invited)

83.  Du, D. X.; Cremons, D. R.; Flannigan, D. J. Quantifying Transient Strain and Energy of Coherent Acoustic Phonons with UEM Imaging. Microsc. Microanal. 2020, 26 (Suppl. 2), 212-214.

Strain Quantification

82.  VandenBussche, E. J.; Clark, C. P.; Holmes, R. J.; Flannigan, D. J. Pulsed Electron Beams for Mitigating Damage in Next-Generation Electronic Materials. Microsc. Microanal. 2020, 26 (Suppl. 2), 2866-2868.

Beam Damage

81.  VandenBussche, E. J.; Flannigan, D. J. Using UEM to Probe Buried Structures in Real Space: An Analog to Phonon Spectroscopy. Microsc. Microanal. 2020, 26 (Suppl. 2), 216-217.

Phonon Spectroscopy Analog

80.  Zhang, Y.; Flannigan, D. J. Strain Patterning via Spontaneous Centroidal Voronoi Tessellation in Few-Layer MoS2. Microsc. Microanal. 2020, 26 (Suppl. 2), 2368-2370.

Tessellation

79.  Du, D. X.; Flannigan, D. J. Imaging Phonon Dynamics with Ultrafast Electron Microscopy: Kinematical and Dynamical Simulations. Struct. Dyn. 2020, 7, 024103. (Invited, AIP SciLight article) (Featured article)

Imaging Photons


78.  Reisbick, S. A.; Zhang, Y.; Flannigan, D. J. Influence of Discrete Defects on Observed Acoustic-Phonon Dynamics in Layered Materials Probed with Ultrafast Electron Microscopy. J. Phys. Chem. A 2020, 124, 1877-1884. (Invited, Special issue: Time-Resolved Microscopy) (Cover article)

TOC Graphic

2019

77.  Zhang, Y.; Flannigan, D. J. Observation of Anisotropic Strain-Wave Dynamics and Few-Layer Dephasing in MoS2 with Ultrafast Electron Microscopy. Nano Lett. 2019, 19, 8216-8224.

TOC Graphic


76.  VandenBussche, E. J.; Flannigan, D. J. Reducing Radiation Damage in Soft Matter with Femtosecond-Timed Single-Electron Packets. Nano Lett. 2019, 19, 6687-6694. chemrxiv.8079755.v2

TOC Graphic


75.  Flannigan, D. J. Watching Plasmonic Crystals Move to the Acoustic Beat. Matter 2019, 1, 308-311. (Invited Preview)

74.  Reisbick, S. A.; Flannigan, D. J. Correlating Atomic-Scale Lattice and Nanoscale Structural Dynamics with Ultrafast Electron Microscopy. Microsc. Microanal. 2019, 25 (Suppl. 2), 950-951.

Correlating Dynamics

73.  Du, D. X.; Flannigan, D. J. Exploring the Connection between Coherent Acoustic Phonons and Bright-Field Contrast in Ultrafast Electron Microscopy. Microsc. Microanal. 2019, 25 (Suppl. 2), 2006-2007.

Phonon Imaging

72.  Gnabasik, R. A.; Valley, D. T.; Quan, M. K.; Ferry, V. E.; Flannigan, D. J. Direct Imaging of Incoherent-to-Coherent Structural Dynamics in Plasmonic Nanorods with Ultrafast Electron Microscopy. Microsc. Microanal. 2019, 25 (Suppl. 2), 2002-2003.

Au NR Dynamics

71.  VandenBussche, E. J.; Flannigan, D. J. Reducing Radiation Damage Using Pulsed Electron Beams in the TEM. Microsc. Microanal. 2019, 25 (Suppl. 2), 1646-1647.

Beam Damage

70.  Zhang, Y.; Flannigan, D. J. Direct Imaging of Localized Anisotropic Acoustic-Phonon Dynamics in MoS2. Microsc. Microanal. 2019, 25 (Suppl. 2), 2128-2129. (2019 Student Scholar Award)

MoS2 Dynamics

69.  VandenBussche, E. J.; Flannigan, D. J. Sources of Error in Debye-Waller-Effect Measurements Relevant to Studies of Photoinduced Structural Dynamics. Ultramicroscopy 2019, 196, 111-120.

Errors in DW-Effect Measurements

2018

68.  Flannigan, D. J. Electrons Film Phonon Dynamics in Full. Physics 201811, 53. (Invited Viewpoint)

67.  Flannigan, D. J.; Lindenberg, A. M. Atomic-scale Imaging of Ultrafast Materials Dynamics.  MRS Bull. 2018, 43, 485-490. (Invited Introductory Article, Special issue: Ultrafast Imaging of Materials Dynamics, Guest Editor).

MRS Cover


66.  Suslick, K. S.; Eddingsaas, N. C.; Flannigan, D. J.; Hopkins, S. D.; Xu, H. The Chemical History of a Bubble. Acc. Chem. Res. 2018, 51, 2169-2178. (Cover article)

SBSL Overview


65.  Flannigan, D. J.; Cremons, D. R.; Du, D. X.; McKenna, A. J.; Plemmons, D. A. Imaging Coherent Structural Dynamics with Ultrafast Electron Microscopy. Microsc. Microanal. 201824 (Suppl. 1), 1838-1839. (Invited)

Coherent Dynamics

64.  Gnabasik, R. A.; Suri, P. K.; Flannigan, D. J. Imaging Coherent Acoustic Phonons in LaFeAsO with Ultrafast Electron Microscopy. Microsc. Microanal. 201824 (Suppl. 1), 1850-1851.

LaFeAsO Dynamics

63.  Reisbick, S. A.; Flannigan, D. J. Charge-Density Wave Localization and Co-Existence in 1T-TaS2. Microsc. Microanal. 201824 (Suppl. 1), 1914-1915. (2018 Student Scholar Award)

CDW TaS2

62.  Du, D. X.; Cremons, D. R.; Flannigan, D. J. Directed Hypersonic Strain Waves Imaged with Ultrafast Electron Microscopy. Microsc. Microanal. 201824 (Suppl. 1), 1912-1913. (2018 Student Scholar Award)

Ge Dynamics

61.  Zhang, Y.; McKenna, A. J.; Flannigan, D. J. Spatially-Resolved Strain-Wave Dynamics in MoS2. Microsc. Microanal. 201824 (Suppl. 1), 1898-1899.

MoS2 Dynamics

60.  VandenBussche, E. J.; Flannigan, D. J. The Effect of a Pulsed Electron Beam on Damage Threshold. Microsc. Microanal. 201824 (Suppl. 1), 2002-2003. (2018 Student Scholar Award)

Pulsed Beam Damage

59.  VandenBussche, E. J.; Flannigan, D. J. Effects of Photoinduced Elastic Responses on Debye-Waller Temperature Measurements. Microsc. Microanal. 201824 (Suppl. 1), 1896-1897.

DW Effects

58.  Liu, J.; Schliep, K. B.; He, S.-H.; Ma, B.; Jing, Y.; Flannigan, D. J.; Wang, J.-P. Iron Nanoparticles with Tunable Tetragonal Structure and Magnetic Properties. Phys. Rev. Mater. 20182, 054415.

CBED of Fe NPs

2017

57.  Cremons, D. R.; Du, D. X.; Flannigan, D. J. Picosecond Phase-Velocity Dispersion of Hypersonic Phonons Imaged with Ultrafast Electron Microscopy. Phys. Rev. Mater. 2017, 1, 073801.

Phase Velocity Dispersion in Ge


56.  Mehedi, Md.; Jiang, Y.; Suri, P. K.; Flannigan, D. J.; Wang, J.-P. Minnealloy: A New Magnetic Material with High Saturation Flux Density and Low Magnetic Anisotropy. J. Phys. D: Appl. Phys. 2017, 50, 37LT01.

toc_1_jpd_2017.png


55.  Schliep, K. B.; Quarterman, P.; Wang, J.-P.; Flannigan, D. J. Picosecond Fresnel Transmission Electron Microscopy. Appl. Phys. Lett. 2017110, 222404.

toc_apl_2017.png


54.  McKenna, A. J.; Eliason, J. K.; Flannigan, D. J. Spatiotemporal Evolution of Coherent Elastic Strain Waves in a Single MoS2 Flake. Nano Lett. 201717, 3952-3958.

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53.  Cremons, D. R.; Plemmons, D. A.; Flannigan, D. J. Defect-Mediated Phonon Dynamics in TaS2 and WSe2. Struct. Dyn. 20174, 044019. (Invited, Special issue: Ultrafast Structural Dynamics - A Tribute to Ahmed H. Zewail) (Featured article)

sd_wse2.png


52.  Plemmons, D. A.; Flannigan, D. J. Ultrafast Electron Microscopy: Instrument Response from the Single-Electron to High Bunch-Charge Regimes. Chem. Phys. Lett. 2017, 683, 186-192. (Invited, Special issue: Ahmed Zewail (1946-2016) Commemoration Issue of Chemical Physics Letters) (List of most-downloaded articles)

toc_cpl_2016.png


51.  Gage, T. E.; Dulal, P.; Solheid, P. A.; Flannigan, D. J.; Stadler, B. J. H. Si-Integrated Ultrathin Films of Phase-Pure Y3Fe5O12 (YIG) via Novel Two-Step Rapid Thermal Anneal. Mater. Res. Lett. 2017, 5, 379-385.

toc_materreslett_2017.png


50.  Flannigan, D. J.*; Cremons, D. R.; Valley, D. T. Multimodal Visualization of the Optomechanical Response of Silicon Cantilevers with Ultrafast Electron Microscopy. J. Mater. Res. 201732, 239-247. (Invited, Special issue: Early Career Scholars in Materials Science)

toc_jmr_2016.png

Supplementary UEM videos:  https://www.youtube.com/playlist?list=PLWgSKgye275Av55mi903k3Fgtk7I0p6ZB

49.  Adhikari, A.; Eliason, J. K.; Sun, J.; Bose, R.; Flannigan, D. J.*; Mohammed, O. F.* Four-Dimensional Ultrafast Electron Microscopy: Insights into an Emerging Technique. ACS Appl. Mater. Interfaces 20179, 3-16.

UTEM

2016

48.  Valley, D. T.; Ferry, V. E.; Flannigan, D. J. Imaging Intra- and Inter-Particle Acousto-Plasmonic Vibrational Dynamics with Ultrafast Electron Microscopy. Nano Lett. 201616, 7302-7308.

toc_nanolett_2016.png


47.  Shore, D.; Pailloux, S. L.; Zhang, J.; Gage, T.; Flannigan, D. J.; Garwood, M.; Pierre, V. C.; Stadler, B. J. H. Electrodeposited Fe and Fe-Au Nanowires as MRI Contrast Agents. Chem. Commun. 201652, 12634-12637.

toc_chemcommun_2016.png


46.  Schliep, K. B.; Chen, J.-Y.; Li, M.; Wang, J.-P.; Flannigan, D. J. Laser-Initiated Magnetization Reversal and Correlated Morphological Effects Visualized with In Situ Fresnel Transmission Electron Microscopy. Phys. Rev. B 201694, 104407. (Featured in Physical Review B Kaleidoscope)

In Situ Mag Reversal


45.  Suri, P. K.; Yan, J.; Mandrus, D. G.; Flannigan, D. J. Dynamical Scattering and Electron Channeling in Orthorhombic and Tetragonal LaFeAsO. J. Phys. Chem. C 2016120, 18931-18938.

toc_jpcc_2016.png


44.  Plemmons, D. A.; Flannigan, D. J. Discrete Chromatic Aberrations Arising from Photoinduced Electron-Photon Interactions in Ultrafast Electron Microscopy. J. Phys. Chem. A 2016120, 3539-3546. (Cover article)

toc_jpca_2016.png


43.  Cremons, D. R.; Plemmons, D. A.; Flannigan, D. J. Morphological Modulation of Acoustic Phonons Imaged with Ultrafast Electron Microscopy. Microsc. Microanal. 201622 (Suppl. 3), 1632-1633.

WSe2 and Ge CAPs

42.  McKenna, A. J.; Eliason, J. K.; Flannigan, D. J. Imaging Photoinduced Structural and Morphological Dynamics of a Single MoS2 Flake with Ultrafast Electron Microscopy. Microsc. Microanal. 201622 (Suppl. 3), 1662-1663.

MoS2 CAPs

41.  Cremons, D. R.; Plemmons, D. A.; Flannigan, D. J. Femtosecond Electron Imaging of Defect-Modulated Phonon Dynamics. Nature Commun. 20167, 11230.

Single Phonon Launch

40.  Cremons, D. R.; Flannigan, D. J. Direct In Situ Thermometry: Variations in Reciprocal-Lattice Vectors and Challenges with the Debye-Waller Effect. Ultramicroscopy 2016161, 10-16.

In Situ Thermal Study


39.  McKenna, A. J.; Flannigan, D. J. Seeing is Educating: The Case for Electron-Microscopy Videos in the Classroom. Microsc. Today 2016, 24, 46-47.

38.  Jiang, Y.; Liu, J.; Suri, P. K.; Thadhani, N. N.; Flannigan, D. J.; Wang, J.-P. Preparation of an α"-Fe16N2 Magnet via a Ball Milling and Shock Compaction Approach. Adv. Eng. Mater. 201618, 1009-1016.

toc_advengmater_2015.png

2015

37.  Suri, P. K.; Yan, J.; Mandrus, D.; Flannigan, D. J. Dynamical Effects on Atomic-Resolution Imaging and Diffraction of the Tetragonal and Orthorhombic Phases of LaFeAsO. Microsc. Microanal. 201521 (Suppl. 3), 813-814.

LaFeAsO


36.  Kieft, E.; Schliep, K. B.; Suri, P. K.; Flannigan, D. J. Effects of Electron-Gun and Laser Parameters on Collection Efficiency and Packet Duration in Ultrafast Electron Microscopy. Microsc. Microanal. 201521 (Suppl. 3), 807-808.

Tecnai Femto Behaviors


35.  Plemmons, D. A.; McKenna, A. J.; Flannigan, D. J. Effects of Quantized, Transient Chromatic Aberrations in Ultrafast Electron Microscopy. Microsc. Microanal. 201521 (Suppl. 3), 805-806.

PINEM Aberrations


34.  Cremons, D. R.; Flannigan, D. J. Diffraction Ring Contraction as a Method of In Situ Thermometry in TEM. Microsc. Microanal. 201521 (Suppl. 3), 967-968.

In Situ Thermometry


33.  Kieft, E.; Schliep, K. B.; Suri, P. K.; Flannigan, D. J. Effects of Thermionic-Gun Parameters on Operating Modes in Ultrafast Electron Microscopy. Struct. Dyn. 20152, 051101.

UEM Photoelectron Packet Behavior


32.  Plemmons, D. A.; Suri, P. K.; Flannigan, D. J. Probing Structural and Electronic Dynamics with Ultrafast Electron Microscopy. Chem. Mater. 201527, 3178-3192. (Invited Up-and-Coming Series Perspective)

toc_chemmater_2015.png

2014

31.  Plemmons, D. A.; Park, S. T.; Zewail, A. H.; Flannigan, D. J. Characterization of Fast Photoelectron Packets in Weak and Strong Laser Fields in Ultrafast Electron Microscopy. Ultramicroscopy 2014146, 97-102.

Measuring the UEM IRF with PINEM


30.  Flannigan, D. J. Spreadsheet-Based Program for Simulating Atomic Emission Spectra. J. Chem. Educ. 201491, 1736-1738.

toc_jce_2014.png


29.  Flannigan, D. J.; Plemmons, D. Electron Pulse Properties and PINEM Aberrations in Ultrafast Transmission Electron Microscopy. In Proceedings of the 18th International Microscopy Congress; Prague, Czech Republic, September 7-12, 2014. (Invited)

PINEM Aberrations

28.  Plemmons, D.; Flannigan, D. J. Practical Considerations for Ultrashort Electron Pulse Characterization in Ultrafast Transmission Electron Microscopy. Microsc. Microanal. 201420 (Suppl. 3), 1588-1589.

PINEM Aberrations

2013

27.  Flannigan, D. J.*; Lourie, O. 4D Ultrafast Electron Microscopy Sheds Light on Dynamic Processes from the Micrometer to the Atomic Scale. Microsc. Anal. 201327, S5-S8. (Cover article, Editor's pick)

cutcnq_cantilever_animated_gif.gif


26.  Cremons, D. R.; Schliep, K. B.; Flannigan, D. J. Diffraction Contrast as a Sensitive Indicator of Femtosecond Sub-Nanoscale Motion in Ultrafast Transmission Electron Microscopy. Proc. SPIE 20138845, 884507.

Reciprocal Lattice Bending


25.  Flannigan, D. J. Photoelectron-Pulse Properties from Free-Free Transitions in Ultrafast Electron Microscopy. Microsc. Microanal. 201319 (Suppl. 2), 1158-1159.

PINEM

24.  Flannigan, D. J.*; Suslick, K. S.* Non-Boltzmann Population Distributions during Single-Bubble Sonoluminescence. J. Phys. Chem. B 2013117, 15886-15893. (Invited, Special issue: Michael D. Fayer Festschrift)

toc_jpcb_2013.png

2012

23.  Flannigan, D. J.; Zewail, A. H. 4D Electron Microscopy: Principles and Applications. Acc. Chem. Res. 201245, 1828-1839. (Cover article, Invited)

toc_acr_2012.png


22.  Flannigan, D. J.*; Suslick, K. S. Temperature Nonequilibration during Single-Bubble Sonoluminescence. J. Phys. Chem. Lett. 20123, 2401-2404.

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Prior to the University of Minnesota

21.  Park, S. T.; Flannigan, D. J.; Zewail, A. H. 4D Electron Microscopy Visualization of Anisotropic Atomic Motions in Carbon Nanotubes. J. Am. Chem. Soc. 2012134, 9146-9149.

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20.  Suslick, K. S.; Flannigan, D. J. Inside a Collapsing Cavity: Sonoluminescence as a Spectroscopic Probe. In Proceedings of the 8th International Symposium on Cavitation; Singapore, August 13-16, 2012; Ohl, C.-D., Klaseboer, E., Ohl, S. W., Gong, S. W., Khoo, B. C., Eds.; Research Publishing Services: Singapore, 2012. (Invited)


2011

19.  Park, S. T.; Flannigan, D. J.; Zewail, A. H. Irreversible Chemical Reactions Visualized in Space and Time with 4D Electron Microscopy. J. Am. Chem. Soc. 2011133, 1730-1733.

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18.  Suslick, K. S.; Eddingsaas, N. C.; Flannigan, D. J.; Hopkins, S. D.; Xu, H. Extreme Conditions during Multibubble Cavitation:  Sonoluminescence as a Spectroscopic Probe. Ultrason. Sonochem. 201118, 842-846. (Invited)

MBSL from Sulfuric Acid

2010

17.  Flannigan, D. J.; Park, S. T.; Zewail, A. H. Nanofriction Visualized in Space and Time by 4D Electron Microscopy. Nano Lett. 201010, 4767-4773.

UEM Nanofriction


16.  Flannigan, D. J.; Suslick, K. S. Inertially Confined Plasma in an Imploding Bubble. Nature Phys. 20106, 598-601.

SBSL Plasma Density

15.  Flannigan, D. J.; Barwick, B.; Zewail, A. H. Biological Imaging with 4D Ultrafast Electron Microscopy. Proc. Natl. Acad. Sci. U.S.A. 2010107, 9933-9937.

PINEM of Protein Vesicles

14.  Flannigan, D. J.; Zewail, A. H. Optomechanical and Crystallization Phenomena Visualized with 4D Electron Microscopy:  Interfacial Carbon Nanotubes on Silicon Nitride. Nano Lett. 201010, 1892-1899.

UEM Optomechanics

2009

13.  Barwick, B.; Flannigan, D. J.; Zewail, A. H. Photon-Induced Near-Field Electron Microscopy. Nature 2009462, 902-906.

PINEM

12.  Flannigan, D. J.; Samartzis, P. C.; Yurtsever, A.; Zewail, A. H. Nanomechanical Motions of Cantilevers:  Direct Imaging in Real-Space and Time with 4D Electron Microscopy. Nano Lett. 20099, 875-881.

UEM Nanomechanics

2008

11.  Suslick, K. S.; Flannigan, D. J. Inside a Collapsing Bubble: Sonoluminescence and the Conditions during Cavitation. Ann. Rev. Phys. Chem. 200859, 659-683. (Invited)

SBSL in SA


10.  Eddingsaas, N. C.; Flannigan, D. J.; Suslick, K. S. Measuring the Extreme Conditions Created during Cavitation. Proceedings of Acoustics '08 (Eur. Acoust. Soc./Acoust. Soc. Amer.:  Paris, 2008), 3565-3570. (Invited)

SBSL Ar Emission with Pa


9.  Drayna, G. K.; Flannigan, D. J. Ultrafast Electron Microscopy: Watching Atoms Move and Crystals Melt. Caltech Undergrad. Res. J. 20088, 36-43.

KTCNQ Specimen

2007

8.  Flannigan, D. J.; Lobastov, V. A.; Zewail, A. H. Controlled Nanoscale Mechanical Phenomena Discovered with Ultrafast Electron Microscopy. Angew. Chem. Int. Ed. 200746, 9206-9210. (Cover article)

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7.  Flannigan, D. J.; Suslick, K. S. Emission from Electronically Excited Metal Atoms during Single-Bubble Sonoluminescence. Phys. Rev. Lett. 200799, 134301. (Editors' Suggestion)

SBSL Metal Emission

2006

6.  Flannigan D. J.; Suslick, K. S. Plasma Quenching by Air during Single-Bubble Sonoluminescence. J. Phys. Chem. A 2006110, 9315-9318. (Cover article)

SBSL NO Emission Temp


5.  Flannigan, D. J.; Hopkins, S. D.; Camara, C. G.; Putterman, S. J.; Suslick, K. S. Measurement of Pressure and Density Inside a Single Sonoluminescing Bubble. Phys. Rev. Lett. 200696, 204301.

SBSL Density

2005

4.  Flannigan, D. J.; Suslick, K. S. Molecular and Atomic Emission during Single-Bubble Cavitation in Concentrated Sulfuric Acid. Acoust. Res. Lett. Online 20056, 157-161. (Invited, Special issue:  Apfel's Acoustics Articulations)

SBSL Molecular Emission


3.  Flannigan, D. J.; Hopkins, S. D.; Suslick, K. S. Sonochemistry and Sonoluminescence in Ionic Liquids, Molten Salts, and Concentrated Electrolytic Solutions. J. Organomet. Chem. 2005, 690, 3513-3517. (Invited, Special issue: Organometallic Chemistry in Ionic Liquids)

Sonochem in Ionic Liquids


2.  Flannigan, D. J.; Suslick, K. S. Plasma Line Emission during Single-Bubble Cavitation. Phys. Rev. Lett. 2005, 95, 044301.

SBSL Plasma Line Emission


1.  Flannigan, D. J.; Suslick, K. S. Plasma Formation and Temperature Measurement during Single-Bubble Cavitation. Nature 2005, 434, 52-55.

SBSL Ar Emission